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Showing results: 436 - 450 of 582 items found.

  • 9 Pin Breakout Interface

    VSI-Breakout-9 - Viewpoint Systems, Inc

    The VSI-Breakout-9 is a very useful tool in debugging signals or software in a system. It allows unlimited access to signals within the cabling that might otherwise be difficult to access. The board gives test points at each side of the connector and jumper with a easy to use tabbed shunt to allow for easy disconnection of any particular signal between the connectors. The jumpers also give an opportunity to inject a signal regardless of what signal was originally being driven.

  • 15 Pin Breakout Interface

    VSI-Breakout-15 - Viewpoint Systems, Inc

    The VSI-Breakout-15 is a very useful tool in debugging signals or software in a system. It allows unlimited access to signals within the cabling that might otherwise be difficult to access. The board gives test points at each side of the connector and jumper with a easy to use tabbed shunt to allow for easy disconnection of any particular signal between the connectors. The jumpers also give an opportunity to inject a signal regardless of what signal was originally being driven.

  • Test System

    ITC57300 - Integrated Technology Corp.

    The ITC57300 Dynamic Parametric Test System mainframe accepts Test Heads that perform nondestructive transient measurements on semiconductor devices such as Insulated Gate Bipolar Transistors (IGBT), power MOSFETs, diodes, and other bipolar devices(requires additional optional bias power supplies and custom personality boards). Included in the mainframe are all test equipment and software necessary to analyze and perform resistive and inductive switching time, switching losses, gate charge, Trr/Qrr, and other transient tests.

  • ATE Integration

    JTAG Technologies Inc.

    Want to improve the overall test coverage of your assembled boards? It’s easy. Simply combine or integrate your JTAG Technologies boundary-scan tools with your existing automatic test equipment (ATE). We work with any vendor of in-circuit testers (ICT), flying probes (FPT) or functional testers (FT).We offer solutions for most of the available automatic test equipment systems, in addition we can support you with customized integrations for your existing automatic test equipment (ATE).

  • Cryogenic Millimeter-Wave / Microwave Test Fixtures and Calibration Kits

    upj10 - KEYCOM Corp

    KEYCOM''s cryogenic millimeter-wave / microwave test fixtures and calibration kits are specifically optimized for testing the performance of patterns between the edges of printed boards(edge type) and circuit testing on the printed boards(probe type). They are also designed to minimize heat capacity by miniaturizing their dimensions so they cool off efficiently, and materials with low coefficient of linear thermal expansion such as invar are used for major parts where high dimensional stability is required. Their operating frequency ranges from DC to 110GHz.

  • Software & Hardware Interface

    XJAPI - XJTAG Ltd.

    The XJAPI is a simple-to-use DLL Application Program Interface (API), designed to give you low-level access to the JTAG chain via either the XJLink or the PXI hardware, allowing easy integration with a wide range of other systems such as development/evaluation boards, test systems

  • 2 Port 4GFC Fibre Channel ARINC818 Test, Simulator and Monitor Module For PCIe

    APS-FC-2 - AIM GmbH

    The APS-FC-2 is AIM’s high performance PCIe module offering 2 ports with full function test, simulation, monitoring and analyzer functions for Fibre Channel networks. The APS-FC-2 is a powerful State-of-the-Art 4-lane PCIe 2.0 compliant PCIe board.

  • Digital I/O with Per Channel Timing, Programmable Logic Levels and PMU PXI Card

    GX5296 - Terotest Systems Ltd.

    The GX5296 offers the most performance and features of any 3U PXI dynamic digital I/O board on the market today. The 32-channel, GX5296 offers timing per pin, multiple time sets, data formatting, and an advanced sequencer – providing users with the capability emulate and test complex digital busses for system, board or device test applications. Offering 1 ns edge placement resolution per pin and a PMU per pin, the GX5296 has the ability to perform both DC and AC parametric testing. Each digital channel can be individually programmed for a drive hi, drive lo, sense hi, sense lo, and load value (with commutation voltage level).

  • Digital Stimulus Response PXI Card

    GX5152 Series - Marvin Test Solutions, Inc.

    The GX5152 Series are high speed, 6U PXI, digital I/O instruments. The GX5152 master controller has 32 I/O channels that supports test rates up to 50 MHz and vector depths up to 128 Mb per pin. The GX5153 slave offers the same timing characteristics and multiple I/O level configurations when used in conjunction with the GX5152. The GX5152 can control up to 15 GX5153 boards using the same timing and sequencer.

  • Digital Stimulus Response PXI Card

    GX5152 - Terotest Systems Ltd.

    The GX5152 Series are high speed, 6U PXI, digital I/O instruments. The GX5152 master controller has 32 I/O channels that supports test rates up to 50 MHz and vector depths up to 128 Mb per pin. The GX5153 slave offers the same timing characteristics and multiple I/O level configurations when used in conjunction with the GX5152. The GX5152 can control up to 15 GX5153 boards using the same timing and sequencer.

  • Function Tester with Low Number of Channels

    UTP 6010 RF - NOFFZ Computer Technik GmbH

    The UTP 6010 is one of our smallest test systems and therefore a cost-effective entry into our UTP tester series.The fast system is used to implement scalable functional test applications for a test item (single device under test) with multiple RF channels and mixed-signal test options. Depending on the adapter, the DUT can be tested at circuit board level (FKT) or when installed at the end of the line (EOL).Depending on the test item requirements, we configure the appropriate number of channels and integrate the necessary interfaces directly in the adapter or tester. The test speed, production volume and overall complexity of the UTP 6010 interfaces can be varied according to your requirements.

  • EOS Tester

    KT-200SG - Kast Eng Co. LTD.

    This test instrument stands for the EMI(Electro Magnetic Immunity) ability test to the electric devices, electronic circuit boards & electric equipments. Recently this instrument is widly used in many companies in Korea & other countries to test the immunity to thier products-power supply, drive PCBs, communication systems, LCD display panels whether they are safe or not against the impulse & noise.All for the purpose, of this object, it generates 4 ~ 5 kinds of different impulse test waveforms.Output test voltage level : 5 ~ 200 V ImpulseOutput voltage polarity : Positive, NegativeType of waveforms

  • Downloading Multifunction Tester

    ET4500 - Martindale Electric Co. Ltd

    The new ET4500 tester carries out all the tests needed to verify the safety of electrical installations in domestic, commercial and industrial wiring installations in accordance with the latest regulations.

    can be used to carry out 3 wire earth testing and has on board memory to store and download all installation test results for documentation.

    Everything about the new ET Series has been designed to save time and make testing easier.Fast, reliable high current and non-trip loop testing comes as standard together with a high level of input protection and a CAT IV safety rating .Supplied with a full range of accessories.

  • Edge Press Technology Bed of Nails Testers

    Prober Edge Press Family - Test Electronics

    Production volume test fixture with swappable test plates, front and rear panel inlays, and multi-testing compatibility with process carrier pallets. Swappable test plates provide the ability for one fixture base to support a variety of units under test. Interchangeable front and rear panel inserts provide further customization. Interoperability with process carrier pallets provide multiple board testing capabilities, panelized testing, and flex circuit testing. A selection of interfaces to general testing equipment provide for a wide selection of customized testing features.

  • Digital I/O PXI Card

    GX5150 - Terotest Systems Ltd.

    The GX5150 Series are high speed, 6U PXI, sequenced digital I/O instruments. The GX5150 master controller has 32 bits of I/O channels that supports test rates of up to 50 MHz and a vector depth of up to 128 Mb per pin. The GX5151 slave offers the same timing characteristics and multiple I/O level configurations when used in conjunction with the GX5150. The GX5150 can control up to 15 GX5151 boards using the same timing and sequencer.

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